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Extreme statistics in nanoscale memo...
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Singhee, Amith.
Extreme statistics in nanoscale memory design
Record Type:
Electronic resources : Monograph/item
Title/Author:
Extreme statistics in nanoscale memory design/ edited by Amith Singhee, Rob A. Rutenbar.
other author:
Rutenbar, Rob A.
Published:
Boston, MA :Springer Science+Business Media LLC, : 2010.,
Description:
ix, 246 p. :ill., digital ; : 24 cm.;
Series:
Integrated circuits and systems,
Contained By:
Springer eBooks
Subject:
Circuits and Systems. -
Online resource:
http://dx.doi.org/10.1007/978-1-4419-6606-3
ISBN:
9781441966063 (electronic bk.)
Extreme statistics in nanoscale memory design
Extreme statistics in nanoscale memory design
[electronic resource] /edited by Amith Singhee, Rob A. Rutenbar. - Boston, MA :Springer Science+Business Media LLC,2010. - ix, 246 p. :ill., digital ;24 cm. - Integrated circuits and systems,1558-9412.
ISBN: 9781441966063 (electronic bk.)Subjects--Topical Terms:
120841
Circuits and Systems.
LC Class. No.: TK7895.M3 / E98 2010
Dewey Class. No.: 621.3973
Extreme statistics in nanoscale memory design
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edited by Amith Singhee, Rob A. Rutenbar.
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2010.
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Extreme value theory.
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Engineering (Springer-11647)
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