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Lifetime Spectroscopy = A Method of ...

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Lifetime Spectroscopy = A Method of Defect Characterization in Silicon for Photovoltaic Applications /

Record Type:	Electronic resources : Monographic component part
Title/Author:	Lifetime Spectroscopy/ by Stefan Rein.
Reminder of title:	A Method of Defect Characterization in Silicon for Photovoltaic Applications /
Author:	Rein, Stefan.
Published:	Berlin, Heidelberg :Springer-Verlag Berlin Heidelberg, : 2005.,
Description:	xxvi, 489 p. :ill., digital ; : 25 cm.;
Series:	Springer Series in Material Science,
Contained By:	Springer e-books
Subject:	Silicon crystals - Defects. -
Online resource:	http://dx.doi.org/10.1007/3-540-27922-9
ISBN:	9783540279228 (electronic bk.)

Lifetime Spectroscopy = A Method of Defect Characterization in Silicon for Photovoltaic Applications /
Rein, Stefan.

Lifetime SpectroscopyA Method of Defect Characterization in Silicon for Photovoltaic Applications /[electronic resource] :by Stefan Rein. - Berlin, Heidelberg :Springer-Verlag Berlin Heidelberg,2005. - xxvi, 489 p. :ill., digital ;25 cm. - Springer Series in Material Science,850933-033X ;.

ISBN: 9783540279228 (electronic bk.)Subjects--Topical Terms:

135525
Silicon crystals
--Defects.

LC Class. No.: TK7871.15.S55 / R45 2005

Dewey Class. No.: 537

Lifetime Spectroscopy = A Method of Defect Characterization in Silicon for Photovoltaic Applications /
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050 1 4 $a TK7871.15.S55 $b R45 2005
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090 $a TK7871.15.S55 $b R364 2005
100 1 $a Rein, Stefan. $3 135524
245 1 0 $a Lifetime Spectroscopy $h [electronic resource] : $b A Method of Defect Characterization in Silicon for Photovoltaic Applications / $c by Stefan Rein.
260 $a Berlin, Heidelberg : $c 2005. $b Springer-Verlag Berlin Heidelberg,
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440 0 $a Springer Series in Material Science, $x 0933-033X ; $v 85
650 0 $a Silicon crystals $x Defects. $3 135525
650 0 $a Silicon crystals $x Spectra. $3 135526
650 1 4 $a Physics. $3 121713
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950 $a Physics and Astronomy (Springer-11651; ZDB-2-PHA)

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