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Kelvin probe force microscopy = meas...
~
Glatzel, Thilo.
Kelvin probe force microscopy = measuring and compensating electrostatic forces /
紀錄類型:
書目-電子資源 : 單行本
正題名/作者:
Kelvin probe force microscopy/ edited by Sascha Sadewasser, Thilo Glatzel.
其他題名:
measuring and compensating electrostatic forces /
其他作者:
Sadewasser, Sascha.
出版者:
Berlin, Heidelberg :Springer-Verlag Berlin Heidelberg, : 2012.,
面頁冊數:
xiv, 331 p. :ill., digital ; : 24 cm.;
Contained By:
Springer eBooks
標題:
Atomic force microscopy. -
電子資源:
http://dx.doi.org/10.1007/978-3-642-22566-6
ISBN:
9783642225666 (electronic bk.)
Kelvin probe force microscopy = measuring and compensating electrostatic forces /
Kelvin probe force microscopy
measuring and compensating electrostatic forces /[electronic resource] :edited by Sascha Sadewasser, Thilo Glatzel. - Berlin, Heidelberg :Springer-Verlag Berlin Heidelberg,2012. - xiv, 331 p. :ill., digital ;24 cm. - Springer series in surface sciences,480931-5195 ;. - Springer series in surface sciences ;48..
ISBN: 9783642225666 (electronic bk.)Subjects--Topical Terms:
241044
Atomic force microscopy.
LC Class. No.: QH212.A78 / K45 2012
Dewey Class. No.: 502.825
Kelvin probe force microscopy = measuring and compensating electrostatic forces /
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