Language: English

Login

Languages

English (1)

Jump To : Overview | Titles | Subjects

Huisman, Leendert M.

Overview

Works:	1 works in 1 publications in 1 languages

Titles

Data Mining and Diagnosing IC Fails by: SpringerLink (Online service); Huisman, Leendert M. (Electronic resources)

Subjects

Electronics and Microelectronics, Instrumentation. Integrated circuits- Testing Semiconductors- Failures. Circuits and Systems. Engineering. Data mining.

Change password

Login