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Huisman, Leendert M.

Overview

Works:	1 works in 1 publications in 1 languages

Titles

Data Mining and Diagnosing IC Fails by: SpringerLink (Online service); Huisman, Leendert M. (Electronic resources)

Subjects

Integrated circuits- Testing Electronics and Microelectronics, Instrumentation. Semiconductors- Failures. Data mining. Engineering. Circuits and Systems.

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