Wen, Xiaoqing.
Overview
Works: | 2 works in 2 publications in 1 languages |
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Titles
VLSI test principles and architectures = design for testability /
by:
Wang, Laung-Terng.; Wen, Xiaoqing.; Wu, Cheng-Wen, (EE Ph. D.)
(Electronic resources)
Power-aware testing and test strategies for low power devices
by:
SpringerLink (Online service); Nicolici, Nicola.; Girard, Patrick.; Wen, Xiaoqing.
(Electronic resources)
Subjects
TECHNOLOGY & ENGINEERING- Electronics
Circuitos integrados vlsi.
Low voltage integrated circuits- Testing.
Low voltage integrated circuits- Power supply.
Integrated circuits / Very large scale integration / Design.
Circuits and Systems.
Engineering.
Integrated circuits- Very large scale integration
Integrated circuits / Very large scale integration / Testing.
Circuits int�egr�es �a tr�es grande �echelle- Conception et construction.
Computer-Aided Engineering (CAD, CAE) and Design.
Testen.
VLSI.
COMPUTERS- Logic Design.
Circuits int�egr�es �a tr�es grande �echelle- Essais.