Wen, Xiaoqing.
概要
| 作品: | 2 作品在 2 項出版品 1 種語言 | |
|---|---|---|
書目資訊
VLSI test principles and architectures = design for testability /
by:
Wang, Laung-Terng.; Wen, Xiaoqing.; Wu, Cheng-Wen, (EE Ph. D.)
(書目-電子資源)
Power-aware testing and test strategies for low power devices
by:
SpringerLink (Online service); Nicolici, Nicola.; Girard, Patrick.; Wen, Xiaoqing.
(書目-電子資源)
主題
TECHNOLOGY & ENGINEERING- Electronics
Circuitos integrados vlsi.
Low voltage integrated circuits- Testing.
Integrated circuits / Very large scale integration / Design.
Low voltage integrated circuits- Power supply.
Circuits and Systems.
Integrated circuits- Very large scale integration
Integrated circuits / Very large scale integration / Testing.
Engineering.
Circuits int�egr�es �a tr�es grande �echelle- Conception et construction.
Testen.
Computer-Aided Engineering (CAD, CAE) and Design.
VLSI.
COMPUTERS- Logic Design.
Circuits int�egr�es �a tr�es grande �echelle- Essais.