語系
Breitenstein, Otwin.
概要
| 作品: | 1 作品在 1 項出版品 1 種語言 | |
|---|---|---|
書目資訊
Lock-in thermography = basics and use for evaluating electronic devices and materials /
by:
Warta, Wilhelm.; Breitenstein, Otwin.; SpringerLink (Online service); Langenkamp, Martin.
(書目-電子資源)
主題
Electronic apparatus and appliances- Thermal properties.
Semiconductors- Thermal properties.
Optics, Optoelectronics, Plasmonics and Optical Devices.
Physics.
Electronic apparatus and appliances- Testing.
Characterization and Evaluation of Materials.
Structural Materials.
Thermography.
Engineering, general.