Diagnostic test approaches to machin...
IGI Global.

 

  • Diagnostic test approaches to machine learning and commonsense reasoning systems
  • 紀錄類型: 書目-電子資源 : 單行本
    正題名/作者: Diagnostic test approaches to machine learning and commonsense reasoning systems/ Xenia Naidenova and Dmitry I. Ignatov, editors.
    其他作者: Naidenova, Xenia,
    出版者: Hershey, Pa. :IGI Global (701 E. Chocolate Avenue, Hershey, Pennsylvania, 17033, USA), : c2013.,
    面頁冊數: 269 p. ;29 cm.;
    標題: Machine learning. -
    電子資源: http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-4666-1900-5
    ISBN: 9781466619012 (ebook)
多媒體
評論
Export
取書館別
 
 
變更密碼
登入