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Built-in-self-test and digital self-...
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SpringerLink (Online service)
Built-in-self-test and digital self-calibration for RF SoCs
Record Type:
Electronic resources : Monograph/item
Title/Author:
Built-in-self-test and digital self-calibration for RF SoCs/ by Sleiman Bou-Sleiman, Mohammed Ismail.
Author:
Bou-Sleiman, Sleiman.
other author:
Ismail, Mohammed.
Published:
New York, NY :Springer Science+Business Media, LLC, : 2012.,
Description:
xvii, 89 p. :digital ; : 24 cm.;
Contained By:
Springer eBooks
Subject:
Electronic Circuits and Devices. -
Online resource:
http://dx.doi.org/10.1007/978-1-4419-9548-3
ISBN:
9781441995483 (electronic bk.)
Built-in-self-test and digital self-calibration for RF SoCs
Bou-Sleiman, Sleiman.
Built-in-self-test and digital self-calibration for RF SoCs
[electronic resource] /by Sleiman Bou-Sleiman, Mohammed Ismail. - New York, NY :Springer Science+Business Media, LLC,2012. - xvii, 89 p. :digital ;24 cm. - SpringerBriefs in electrical and computer engineering. - SpringerBriefs in electrical and computer engineering..
ISBN: 9781441995483 (electronic bk.)Subjects--Topical Terms:
240585
Electronic Circuits and Devices.
LC Class. No.: TK6561 / .B68 2012
Dewey Class. No.: 621.38412
Built-in-self-test and digital self-calibration for RF SoCs
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