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High quality test pattern generation...
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SpringerLink (Online service)
High quality test pattern generation and boolean satisfiability
Record Type:
Electronic resources : Monograph/item
Title/Author:
High quality test pattern generation and boolean satisfiability/ by Stephan EggersgluB, Rolf Drechsler.
Author:
Eggersgluss, Stephan.
other author:
Drechsler, Rolf.
Published:
Boston, MA :Springer US, : 2012.,
Description:
xviii, 193 p. :ill., digital ; : 24 cm.;
Contained By:
Springer eBooks
Subject:
Integrated circuits - Testing. -
Online resource:
http://dx.doi.org/10.1007/978-1-4419-9976-4
ISBN:
9781441999764 (electronic bk.)
High quality test pattern generation and boolean satisfiability
Eggersgluss, Stephan.
High quality test pattern generation and boolean satisfiability
[electronic resource] /by Stephan EggersgluB, Rolf Drechsler. - Boston, MA :Springer US,2012. - xviii, 193 p. :ill., digital ;24 cm.
ISBN: 9781441999764 (electronic bk.)Subjects--Topical Terms:
243448
Integrated circuits
--Testing.
LC Class. No.: TK7874 / .E34 2012
Dewey Class. No.: 621.395
High quality test pattern generation and boolean satisfiability
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by Stephan EggersgluB, Rolf Drechsler.
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Boston, MA :
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2012.
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Springer US,
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xviii, 193 p. :
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24 cm.
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Integrated circuits
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Circuits and Systems.
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Engineering (Springer-11647)
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