Statistical performance analysis and...
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  • Statistical performance analysis and modeling techniques for nanometer VLSI designs
  • Record Type: Electronic resources : Monograph/item
    Title/Author: Statistical performance analysis and modeling techniques for nanometer VLSI designs/ by Ruijing Shen, Sheldon X.-D. Tan, Hao Yu.
    Author: Shen, Ruijing.
    other author: Tan, Sheldon X.-D.
    Published: Boston, MA :Springer US, : 2012.,
    Description: xxix, 305 p. :ill., digital ; : 24 cm.;
    Contained By: Springer eBooks
    Subject: Integrated circuits - Very large scale integration -
    Online resource: http://dx.doi.org/10.1007/978-1-4614-0788-1
    ISBN: 9781461407881 (electronic bk.)
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