Record Type: |
Electronic resources
: Monograph/item
|
Title/Author: |
VLSI test principles and architectures/ edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen. |
Reminder of title: |
design for testability / |
other author: |
Wang, Laung-Terng. |
Published: |
Amsterdam ;Elsevier Morgan Kaufmann Publishers, : c2006., |
Description: |
1 online resource (xxx, 777 p.) :ill. : |
Subject: |
Integrated circuits - Very large scale integration - |
Online resource: |
http://www.sciencedirect.com/science/book/9780123705976 |
ISBN: |
9780123705976 |