新生學校財團法人新生醫護管理專科學校圖書館 |

語系: 繁體中文

說明(常見問題)

回圖書館

登入

回首頁

切換: 標籤 | MARC模式 | ISBD

Thin Film Materials : = Stress, Defe...

Freund, L. B.

Thin Film Materials : = Stress, Defect Formation and Surface Evolution.

紀錄類型:	書目-電子資源 : 單行本
正題名/作者:	Thin Film Materials :/
其他題名:	Stress, Defect Formation and Surface Evolution.
作者:	Freund, L. B.
其他作者:	Suresh, S.
出版者:	Cambridge :Cambridge University Press, : 2004.,
面頁冊數:	770 p.
標題:	Thin films. -
電子資源:	Click here to view book
ISBN:	9780511754715 (electronic bk.)

Thin Film Materials : = Stress, Defect Formation and Surface Evolution.
Freund, L. B.

Thin Film Materials :Stress, Defect Formation and Surface Evolution.[electronic resource]. - Cambridge :Cambridge University Press,2004. - 770 p.

Cover; Half-title; Title; Copyright; Dedication; Contents; Preface; 1 Introduction and Overview; 2 Film stress and substrate curvature; 3 Stress in anisotropic and patterned films; 4 Delamination and fracture; Film buckling, bulging and peeling; 6 Dislocation formation in epitaxial systems; 7 Dislocation interactions and strain relaxation; 8 Equilibrium and stability of surfaces; 9 The role of stress in mass transport; References; Author index; Subject index

Thin films play an important role in many technological applications which include: microelectronic devices, magnetic storage media and surface coatings. Highly illustrated and containing numerous homework problems, this book will be essential reading on senior undergraduate and graduate courses on thin films.

Electronic reproduction.

Available via World Wide Web.

Mode of access: World Wide Web.

ISBN: 9780511754715 (electronic bk.)Subjects--Topical Terms:

125731
Thin films.
Index Terms--Genre/Form:

96803
Electronic books.

LC Class. No.: TA418.9.T45 F74 2003eb

Dewey Class. No.: 621.38152

Thin Film Materials : = Stress, Defect Formation and Surface Evolution.
LDR:01677nmm a22002773u 4500 001 148561
003 AU-PeEL
005 20090601202838.0
006 m d
007 cr mn---------
008 160127t2004 ||| s |||||||eng|d
020 $a 9780511754715 (electronic bk.)
020 $a 9780521822817 (print)
035 $a EBL255084
035 $a EBL255084
040 $a AU-PeEL $c AU-PeEL $d AU-PeEL
050 0 0 $a TA418.9.T45 F74 2003eb
082 0 0 $a 621.38152
100 1 $a Freund, L. B. $3 277110
245 1 0 $a Thin Film Materials : $b Stress, Defect Formation and Surface Evolution. $h [electronic resource].
260 $a Cambridge : $c 2004. $b Cambridge University Press,
300 $a 770 p.
505 0 $a Cover; Half-title; Title; Copyright; Dedication; Contents; Preface; 1 Introduction and Overview; 2 Film stress and substrate curvature; 3 Stress in anisotropic and patterned films; 4 Delamination and fracture; Film buckling, bulging and peeling; 6 Dislocation formation in epitaxial systems; 7 Dislocation interactions and strain relaxation; 8 Equilibrium and stability of surfaces; 9 The role of stress in mass transport; References; Author index; Subject index
520 $a Thin films play an important role in many technological applications which include: microelectronic devices, magnetic storage media and surface coatings. Highly illustrated and containing numerous homework problems, this book will be essential reading on senior undergraduate and graduate courses on thin films.
533 $a Electronic reproduction. $n Available via World Wide Web.
538 $a Mode of access: World Wide Web.
650 4 $a Thin films. $3 125731
655 7 $a Electronic books. $2 local. $3 96803
700 1 $a Suresh, S. $3 277111
710 2 $a Ebooks Corporation. $3 197505
776 1 $z 9780521822817
856 4 0 $z Click here to view book $u http://ebooks.cambridge.org/ebook.jsf?bid=CBO9780511754715

筆 0 讀者評論

多媒體

評論

新增評論分享你的心得

Export

取書館別