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Atomic scale characterization and fi...
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Walkosz, Weronika.
Atomic scale characterization and first-principles studies of Si3N4 interfaces
Record Type:
Electronic resources : Monograph/item
Title/Author:
Atomic scale characterization and first-principles studies of Si3N4 interfaces/ by Weronika Walkosz.
Author:
Walkosz, Weronika.
Published:
New York, NY :Springer Science+Business Media, LLC, : 2011.,
Description:
xiii, 108 p. :ill., digital ; : 24 cm.;
Series:
Springer theses
Contained By:
Springer eBooks
Subject:
Interfaces (Physical sciences) -
Online resource:
http://dx.doi.org/10.1007/978-1-4419-7817-2
ISBN:
9781441978172 (electronic bk.)
Atomic scale characterization and first-principles studies of Si3N4 interfaces
Walkosz, Weronika.
Atomic scale characterization and first-principles studies of Si3N4 interfaces
[electronic resource] /by Weronika Walkosz. - New York, NY :Springer Science+Business Media, LLC,2011. - xiii, 108 p. :ill., digital ;24 cm. - Springer theses.
ISBN: 9781441978172 (electronic bk.)Subjects--Topical Terms:
123438
Interfaces (Physical sciences)
LC Class. No.: QC173.4.I57 / W35 2011
Dewey Class. No.: 541.33
Atomic scale characterization and first-principles studies of Si3N4 interfaces
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[electronic resource] /
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by Weronika Walkosz.
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New York, NY :
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2011.
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Springer Science+Business Media, LLC,
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xiii, 108 p. :
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24 cm.
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Interfaces (Physical sciences)
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Chemistry and Materials Science (Springer-11644)
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