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Photomodulated optical reflectance =...

Bogdanowicz, Janusz.

Photomodulated optical reflectance = a fundamental study aimed at non-destructive carrier profiling in silicon /

紀錄類型:	書目-電子資源 : 單行本
正題名/作者:	Photomodulated optical reflectance/ by Janusz Bogdanowicz.
其他題名:	a fundamental study aimed at non-destructive carrier profiling in silicon /
作者:	Bogdanowicz, Janusz.
出版者:	Berlin, Heidelberg :Springer Berlin Heidelberg, : 2012.,
面頁冊數:	xxiii, 201 p. :ill., digital ; : 24 cm.;
Contained By:	Springer eBooks
標題:	Semiconductors - Testing -
電子資源:	http://dx.doi.org/10.1007/978-3-642-30108-7
ISBN:	9783642301087 (electronic bk.)

Photomodulated optical reflectance = a fundamental study aimed at non-destructive carrier profiling in silicon /
Bogdanowicz, Janusz.

Photomodulated optical reflectancea fundamental study aimed at non-destructive carrier profiling in silicon /[electronic resource] :by Janusz Bogdanowicz. - Berlin, Heidelberg :Springer Berlin Heidelberg,2012. - xxiii, 201 p. :ill., digital ;24 cm. - Springer theses,2190-5053. - Springer theses..

ISBN: 9783642301087 (electronic bk.)Subjects--Topical Terms:

358356
Semiconductors
--Testing

LC Class. No.: TK7871.85 / .B64 2012

Dewey Class. No.: 537.6226

Photomodulated optical reflectance = a fundamental study aimed at non-destructive carrier profiling in silicon /
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