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Modern approaches in applied intelli...
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SpringerLink (Online service)
Modern approaches in applied intelligence = 24th international conference on industrial engineering and other applications of applied intelligent systems, IEA/AIE 2011, Syracuse, NY, USA, June 28 - July 1, 2011 : proceedings.. Part II /
紀錄類型:
書目-電子資源 : 單行本
正題名/作者:
Modern approaches in applied intelligence/ edited by Kishan G. Mehrotra ... [et al.].
其他題名:
24th international conference on industrial engineering and other applications of applied intelligent systems, IEA/AIE 2011, Syracuse, NY, USA, June 28 - July 1, 2011 : proceedings.
其他題名:
IEA/AIE 2011
其他作者:
Mehrotra, Kishan G.
團體作者:
Congress on Progress and Controversies in Oncological Urology
出版者:
Berlin, Heidelberg :Springer-Verlag GmbH Berlin Heidelberg, : 2011.,
面頁冊數:
xx, 581 p. :ill., digital ; : 24 cm.;
叢書名:
Lecture notes in computer science,
Contained By:
Springer eBooks
標題:
Database Management. -
電子資源:
http://dx.doi.org/10.1007/978-3-642-21827-9
ISBN:
9783642218279 (electronic bk.)
Modern approaches in applied intelligence = 24th international conference on industrial engineering and other applications of applied intelligent systems, IEA/AIE 2011, Syracuse, NY, USA, June 28 - July 1, 2011 : proceedings.. Part II /
Modern approaches in applied intelligence
24th international conference on industrial engineering and other applications of applied intelligent systems, IEA/AIE 2011, Syracuse, NY, USA, June 28 - July 1, 2011 : proceedings.Part II /[electronic resource] :IEA/AIE 2011edited by Kishan G. Mehrotra ... [et al.]. - Berlin, Heidelberg :Springer-Verlag GmbH Berlin Heidelberg,2011. - xx, 581 p. :ill., digital ;24 cm. - Lecture notes in computer science,67040302-9743 ;.
ISBN: 9783642218279 (electronic bk.)Subjects--Topical Terms:
120931
Database Management.
LC Class. No.: Q334 / .I58 2011
Dewey Class. No.: 006.3
Modern approaches in applied intelligence = 24th international conference on industrial engineering and other applications of applied intelligent systems, IEA/AIE 2011, Syracuse, NY, USA, June 28 - July 1, 2011 : proceedings.. Part II /
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