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Microelectronic test structures for ...
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Microelectronic test structures for CMOS technology
紀錄類型:
書目-電子資源 : 單行本
正題名/作者:
Microelectronic test structures for CMOS technology/ by Manjul Bhushan, Mark B. Ketchen.
作者:
Bhushan, Manjul.
其他作者:
Ketchen, Mark B.
出版者:
New York, NY :Springer Science+Business Media, LLC, : 2011.,
面頁冊數:
xxxiv, 373 p. :ill., digital ; : 24 cm.;
Contained By:
Springer eBooks
標題:
Circuits and Systems. -
電子資源:
http://dx.doi.org/10.1007/978-1-4419-9377-9
ISBN:
9781441993779 (electronic bk.)
Microelectronic test structures for CMOS technology
Bhushan, Manjul.
Microelectronic test structures for CMOS technology
[electronic resource] /by Manjul Bhushan, Mark B. Ketchen. - New York, NY :Springer Science+Business Media, LLC,2011. - xxxiv, 373 p. :ill., digital ;24 cm.
ISBN: 9781441993779 (electronic bk.)Subjects--Topical Terms:
120841
Circuits and Systems.
LC Class. No.: TK7871.99.M44 / B48 2011
Dewey Class. No.: 621.38152
Microelectronic test structures for CMOS technology
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