新生學校財團法人新生醫護管理專科學校圖書館 |

Language: English

Back

Advanced test methods for SRAMs = ef...

SpringerLink (Online service)

Advanced test methods for SRAMs = effective solutions for dynamic fault detection in nanoscaled technologies /

Record Type:	Electronic resources : Monograph/item
Title/Author:	Advanced test methods for SRAMs/ by Alberto Bosio ... [et al.].
Reminder of title:	effective solutions for dynamic fault detection in nanoscaled technologies /
other author:	Bosio, Alberto.
Published:	Boston, MA :Springer-Verlag US, : 2010.,
Description:	xv, 171 p. :ill., digital ; : 24 cm.;
Contained By:	Springer eBooks
Subject:	Computer-Aided Engineering (CAD, CAE) and Design. -
Online resource:	http://dx.doi.org/10.1007/978-1-4419-0938-1
ISBN:	9781441909381 (electronic bk.)

Advanced test methods for SRAMs = effective solutions for dynamic fault detection in nanoscaled technologies /
Advanced test methods for SRAMseffective solutions for dynamic fault detection in nanoscaled technologies /[electronic resource] :by Alberto Bosio ... [et al.]. - Boston, MA :Springer-Verlag US,2010. - xv, 171 p. :ill., digital ;24 cm.

ISBN: 9781441909381 (electronic bk.)Subjects--Topical Terms:

120967
Computer-Aided Engineering (CAD, CAE) and Design.

LC Class. No.: TK7895.M4 / A3185 2010

Dewey Class. No.: 621.3973

Advanced test methods for SRAMs = effective solutions for dynamic fault detection in nanoscaled technologies /
LDR:00820nmm 2200229 a 4500 001 190314
003 Springer
005 20101125133821.0
006 m d
007 cr nn 008maaau
008 170314s2010 mau s j eng d
020 $a 9781441909381 (electronic bk.)
020 $a 9781441909374 (paper)
035 $a 978-1-4419-0937-4
050 0 4 $a TK7895.M4 $b A3185 2010
082 0 4 $a 621.3973 $2 22
090 $a TK7895.M4 $b A244 2010
245 0 0 $a Advanced test methods for SRAMs $h [electronic resource] : $b effective solutions for dynamic fault detection in nanoscaled technologies / $c by Alberto Bosio ... [et al.].
260 $a Boston, MA : $c 2010. $b Springer-Verlag US,
300 $a xv, 171 p. : $b ill., digital ; $c 24 cm.
650 2 4 $a Computer-Aided Engineering (CAD, CAE) and Design. $3 120967
650 2 4 $a Circuits and Systems. $3 120841
650 1 4 $a Engineering. $3 120442
650 0 $a Random access memory $x Testing. $3 367918
700 1 $a Bosio, Alberto. $3 367917
710 2 $a SpringerLink (Online service) $3 120363
773 0 $t Springer eBooks
856 4 0 $u http://dx.doi.org/10.1007/978-1-4419-0938-1
950 $a Engineering (Springer-11647)

Multimedia

Reviews

Export

pickup library