Advanced test methods for SRAMs = ef...
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  • Advanced test methods for SRAMs = effective solutions for dynamic fault detection in nanoscaled technologies /
  • 紀錄類型: 書目-電子資源 : 單行本
    正題名/作者: Advanced test methods for SRAMs/ by Alberto Bosio ... [et al.].
    其他題名: effective solutions for dynamic fault detection in nanoscaled technologies /
    其他作者: Bosio, Alberto.
    出版者: Boston, MA :Springer-Verlag US, : 2010.,
    面頁冊數: xv, 171 p. :ill., digital ; : 24 cm.;
    Contained By: Springer eBooks
    標題: Computer-Aided Engineering (CAD, CAE) and Design. -
    電子資源: http://dx.doi.org/10.1007/978-1-4419-0938-1
    ISBN: 9781441909381 (electronic bk.)
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