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Power-aware testing and test strateg...
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SpringerLink (Online service)
Power-aware testing and test strategies for low power devices
紀錄類型:
書目-電子資源 : 單行本
正題名/作者:
Power-aware testing and test strategies for low power devices/ edited by Patrick Girard, Nicola Nicolici, Xiaoqing Wen.
其他作者:
Wen, Xiaoqing.
出版者:
Boston, MA :Springer Science+Business Media, LLC, : 2010.,
面頁冊數:
382 p. :ill., digital ; : 24 cm.;
Contained By:
Springer eBooks
標題:
Computer-Aided Engineering (CAD, CAE) and Design. -
電子資源:
http://dx.doi.org/10.1007/978-1-4419-0928-2
ISBN:
9781441909282 (electronic bk.)
Power-aware testing and test strategies for low power devices
Power-aware testing and test strategies for low power devices
[electronic resource] /edited by Patrick Girard, Nicola Nicolici, Xiaoqing Wen. - Boston, MA :Springer Science+Business Media, LLC,2010. - 382 p. :ill., digital ;24 cm.
ISBN: 9781441909282 (electronic bk.)Subjects--Topical Terms:
120967
Computer-Aided Engineering (CAD, CAE) and Design.
LC Class. No.: TK7874 / .P69 2010
Dewey Class. No.: 621.3815
Power-aware testing and test strategies for low power devices
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