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Lock-in thermography = basics and us...
~
Warta, Wilhelm.
Lock-in thermography = basics and use for evaluating electronic devices and materials /
紀錄類型:
書目-電子資源 : 單行本
正題名/作者:
Lock-in thermography/ by Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp.
其他題名:
basics and use for evaluating electronic devices and materials /
作者:
Breitenstein, Otwin.
其他作者:
Langenkamp, Martin.
出版者:
Berlin, Heidelberg :Springer-Verlag Berlin Heidelberg, : 2010.,
面頁冊數:
x, 255 p. :ill., digital ; : 24 cm.;
叢書名:
Springer series in advanced microelectronics,
Contained By:
Springer eBooks
標題:
Structural Materials. -
電子資源:
http://dx.doi.org/10.1007/978-3-642-02417-7
ISBN:
9783642024177 (electronic bk.)
Lock-in thermography = basics and use for evaluating electronic devices and materials /
Breitenstein, Otwin.
Lock-in thermography
basics and use for evaluating electronic devices and materials /[electronic resource] :by Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp. - 2nd ed. - Berlin, Heidelberg :Springer-Verlag Berlin Heidelberg,2010. - x, 255 p. :ill., digital ;24 cm. - Springer series in advanced microelectronics,101437-0387 ;.
ISBN: 9783642024177 (electronic bk.)Subjects--Topical Terms:
121173
Structural Materials.
LC Class. No.: TK7870.25 / .B74 2010
Dewey Class. No.: 621.381548
Lock-in thermography = basics and use for evaluating electronic devices and materials /
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