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Microscopy of Semiconducting Materia...
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Cullis, A. G.
Microscopy of Semiconducting Materials 2007 = proceedings of the 15th Conference, 2-5 April, 2007, Cambridge, UK /
紀錄類型:
書目-電子資源 : 單行本
正題名/作者:
Microscopy of Semiconducting Materials 2007/ edited by A. G. Cullis, P. A. Midgley.
其他題名:
proceedings of the 15th Conference, 2-5 April, 2007, Cambridge, UK /
其他作者:
Midgley, P. A.
出版者:
Dordrecht :Springer Netherlands, : 2008.,
面頁冊數:
xiv, 497 p. :ill., digital ; : 24 cm.;
叢書名:
Springer proceedings in physics,
Contained By:
Springer eBooks
標題:
Measurement Science, Instrumentation. -
電子資源:
http://dx.doi.org/10.1007/978-1-4020-8615-1
ISBN:
9781402086151 (electronic bk.)
Microscopy of Semiconducting Materials 2007 = proceedings of the 15th Conference, 2-5 April, 2007, Cambridge, UK /
Microscopy of Semiconducting Materials 2007
proceedings of the 15th Conference, 2-5 April, 2007, Cambridge, UK /[electronic resource] :edited by A. G. Cullis, P. A. Midgley. - Dordrecht :Springer Netherlands,2008. - xiv, 497 p. :ill., digital ;24 cm. - Springer proceedings in physics,1200930-8989 ;.
ISBN: 9781402086151 (electronic bk.)Subjects--Topical Terms:
121792
Measurement Science, Instrumentation.
Dewey Class. No.: 620.198
Microscopy of Semiconducting Materials 2007 = proceedings of the 15th Conference, 2-5 April, 2007, Cambridge, UK /
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