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Applied Scanning Probe Methods. = Ch...
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Applied Scanning Probe Methods. = Characterization /. IX
紀錄類型:
書目-電子資源 : 分析款目
正題名/作者:
Applied Scanning Probe Methods./ edited by Masahiko Tomitori, Bharat Bhushan, Harald Fuchs.
其他題名:
Characterization /
其他作者:
Tomitori, Masahiko.
出版者:
Berlin, Heidelberg :Springer-Verlag, : 2008.,
面頁冊數:
387 p. :ill., digital ; : 24 cm.;
叢書名:
Nano Science and Technolgy,
Contained By:
Springer eBooks
標題:
Scanning probe microscopy. -
電子資源:
http://dx.doi.org/10.1007/978-3-540-74083-4
ISBN:
9783540740834 (electronic bk.)
Applied Scanning Probe Methods. = Characterization /. IX
Applied Scanning Probe Methods.
Characterization /IX[electronic resource] :edited by Masahiko Tomitori, Bharat Bhushan, Harald Fuchs. - Berlin, Heidelberg :Springer-Verlag,2008. - 387 p. :ill., digital ;24 cm. - Nano Science and Technolgy,1434-4904.
ISBN: 9783540740834 (electronic bk.)Subjects--Topical Terms:
122240
Scanning probe microscopy.
LC Class. No.: TA417.23 / .A655 2008
Dewey Class. No.: 502.82
Applied Scanning Probe Methods. = Characterization /. IX
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