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Emerging Nanotechnologies = Test, De...
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SpringerLink (Online service)
Emerging Nanotechnologies = Test, Defect Tolerance, and Reliability /
紀錄類型:
書目-電子資源 : 分析款目
正題名/作者:
Emerging Nanotechnologies/ edited by Mohammad Tehranipoor.
其他題名:
Test, Defect Tolerance, and Reliability /
其他作者:
Tehranipoor, Mohammad.
出版者:
Boston, MA :Springer Science+Business Media, LLC, : 2008.,
面頁冊數:
xii, 405 p. :ill., digital ; : 24 cm.;
叢書名:
Frontiers in Electronic Testing,
Contained By:
Springer eBooks
標題:
Nanotechnology. -
電子資源:
http://dx.doi.org/10.1007/978-0-387-74747-7
ISBN:
9780387747477 (electronic bk.)
Emerging Nanotechnologies = Test, Defect Tolerance, and Reliability /
Emerging Nanotechnologies
Test, Defect Tolerance, and Reliability /[electronic resource] :edited by Mohammad Tehranipoor. - Boston, MA :Springer Science+Business Media, LLC,2008. - xii, 405 p. :ill., digital ;24 cm. - Frontiers in Electronic Testing,370929-1296 ;.
ISBN: 9780387747477 (electronic bk.)Subjects--Topical Terms:
101595
Nanotechnology.
LC Class. No.: T174.7 / .E44 2008
Dewey Class. No.: 620.5
Emerging Nanotechnologies = Test, Defect Tolerance, and Reliability /
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