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Physical Principles of Electron Micr...

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Physical Principles of Electron Microscopy = An Introduction to TEM, SEM, and AEM /

Record Type:	Electronic resources : Monographic component part
Title/Author:	Physical Principles of Electron Microscopy/ by Ray F. Egerton.
Reminder of title:	An Introduction to TEM, SEM, and AEM /
Author:	Egerton, Ray F..
Published:	Boston, MA :Springer Science+Business Media, Inc., : 2005.,
Description:	xii, 202 p. :ill., digital ; : 25 cm.;
Contained By:	Springer e-books
Subject:	Electron microscopy. -
Online resource:	http://dx.doi.org/10.1007/b136495
ISBN:	9780387260167 (electronic bk.)

Physical Principles of Electron Microscopy = An Introduction to TEM, SEM, and AEM /
Egerton, Ray F..

Physical Principles of Electron MicroscopyAn Introduction to TEM, SEM, and AEM /[electronic resource] :by Ray F. Egerton. - Boston, MA :Springer Science+Business Media, Inc.,2005. - xii, 202 p. :ill., digital ;25 cm.

ISBN: 9780387260167 (electronic bk.)Subjects--Topical Terms:

125728
Electron microscopy.

LC Class. No.: QH212.E4 / E354 2005

Dewey Class. No.: 502.825

Physical Principles of Electron Microscopy = An Introduction to TEM, SEM, and AEM /
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020 $a 9780387258003 (paper)
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100 1 $a Egerton, Ray F.. $3 125727
245 1 0 $a Physical Principles of Electron Microscopy $h [electronic resource] : $b An Introduction to TEM, SEM, and AEM / $c by Ray F. Egerton.
260 $a Boston, MA : $c 2005. $b Springer Science+Business Media, Inc.,
300 $a xii, 202 p. : $b ill., digital ; $c 25 cm.
650 0 $a Electron microscopy. $3 125728
650 1 4 $a Chemistry. $3 87604
650 2 4 $a Characterization and Evaluation Materials. $3 125692
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950 $a Chemistry and Materials Science (Springer-11644; ZDB-2-CMS)

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