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Physical Principles of Electron Micr...

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Physical Principles of Electron Microscopy = An Introduction to TEM, SEM, and AEM /

紀錄類型:	書目-電子資源 : 分析款目
正題名/作者:	Physical Principles of Electron Microscopy/ by Ray F. Egerton.
其他題名:	An Introduction to TEM, SEM, and AEM /
作者:	Egerton, Ray F..
出版者:	Boston, MA :Springer Science+Business Media, Inc., : 2005.,
面頁冊數:	xii, 202 p. :ill., digital ; : 25 cm.;
Contained By:	Springer e-books
標題:	Electron microscopy. -
電子資源:	http://dx.doi.org/10.1007/b136495
ISBN:	9780387260167 (electronic bk.)

Physical Principles of Electron Microscopy = An Introduction to TEM, SEM, and AEM /
Egerton, Ray F..

Physical Principles of Electron MicroscopyAn Introduction to TEM, SEM, and AEM /[electronic resource] :by Ray F. Egerton. - Boston, MA :Springer Science+Business Media, Inc.,2005. - xii, 202 p. :ill., digital ;25 cm.

ISBN: 9780387260167 (electronic bk.)Subjects--Topical Terms:

125728
Electron microscopy.

LC Class. No.: QH212.E4 / E354 2005

Dewey Class. No.: 502.825

Physical Principles of Electron Microscopy = An Introduction to TEM, SEM, and AEM /
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