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Data Mining and Diagnosing IC Fails
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SpringerLink (Online service)
Data Mining and Diagnosing IC Fails
紀錄類型:
書目-電子資源 : 分析款目
正題名/作者:
Data Mining and Diagnosing IC Fails/ by Leendert M. Huisman.
作者:
Huisman, Leendert M.
出版者:
Boston, MA :Springer Science+Business Media, Inc., : 2005.,
面頁冊數:
270 p. :ill., digital ; : 24 cm.;
叢書名:
Frontiers in Electronic Testing,
Contained By:
Springer e-books
標題:
Integrated circuits - Testing -
電子資源:
http://dx.doi.org/10.1007/b137446
ISBN:
9780387263519 (electronic bk.)
Data Mining and Diagnosing IC Fails
Huisman, Leendert M.
Data Mining and Diagnosing IC Fails
[electronic resource] /by Leendert M. Huisman. - Boston, MA :Springer Science+Business Media, Inc.,2005. - 270 p. :ill., digital ;24 cm. - Frontiers in Electronic Testing,310929-1296 ;.
ISBN: 9780387263519 (electronic bk.)Subjects--Topical Terms:
133063
Integrated circuits
--Testing
LC Class. No.: TK7874 / .H85 2005
Dewey Class. No.: 621.381548
Data Mining and Diagnosing IC Fails
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