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Handbook of instrumentation and tech...
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World Scientific (Firm)
Handbook of instrumentation and techniques for semiconductor nanostructure characterization
紀錄類型:
書目-電子資源 : 單行本
正題名/作者:
Handbook of instrumentation and techniques for semiconductor nanostructure characterization/ editors, Richard Haight, Frances M. Ross, James B. Hannon.
其他作者:
Hannon, James B.
出版者:
Singapore ;World Scientific Pub. Co., : c2012.,
面頁冊數:
xxiv, [321] p. :ill. (some col.) :
標題:
Nanotechnology - Handbooks, manuals, etc. -
電子資源:
Volume 1 & 2
ISBN:
9789814322843 (electronic bk.)
Handbook of instrumentation and techniques for semiconductor nanostructure characterization
Handbook of instrumentation and techniques for semiconductor nanostructure characterization
[electronic resource] /editors, Richard Haight, Frances M. Ross, James B. Hannon. - Singapore ;World Scientific Pub. Co.,c2012. - xxiv, [321] p. :ill. (some col.) - World Scientific series in materials and energy ;1-2. - World Scientific series in materials and energy ;1-2..
Includes bibliographical references and index.
Electronic reproduction.
Singapore :
World Scientific Publishing Co.,
2012.
System requirements: Adobe Acrobat Reader.
ISBN: 9789814322843 (electronic bk.)Subjects--Topical Terms:
125816
Nanotechnology
--Handbooks, manuals, etc.
LC Class. No.: TA418.9.N35
Dewey Class. No.: 620.5
Handbook of instrumentation and techniques for semiconductor nanostructure characterization
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c2012.
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xxiv, [321] p. :
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ill. (some col.)
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Includes bibliographical references and index.
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Volume 1 & 2
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