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Data modeling for metrology and test...
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Pavese, Franco.
Data modeling for metrology and testing in measurement science
紀錄類型:
書目-電子資源 : 單行本
正題名/作者:
Data modeling for metrology and testing in measurement science/ edited by Franco Pavese, Alistair B. Forbes.
其他作者:
Forbes, Alistair B.
出版者:
Boston :Birkhauser Boston, : 2009.,
面頁冊數:
xvii, 489 p. :ill., digital ; : 24 cm.;
叢書名:
Modeling and simulation in science, engineering and technology
Contained By:
Springer eBooks
標題:
Probability Theory and Stochastic Processes. -
電子資源:
http://dx.doi.org/10.1007/978-0-8176-4804-6
ISBN:
9780817648046 (electronic bk.)
Data modeling for metrology and testing in measurement science
Data modeling for metrology and testing in measurement science
[electronic resource] /edited by Franco Pavese, Alistair B. Forbes. - Boston :Birkhauser Boston,2009. - xvii, 489 p. :ill., digital ;24 cm. - Modeling and simulation in science, engineering and technology.
ISBN: 9780817648046 (electronic bk.)Subjects--Topical Terms:
120453
Probability Theory and Stochastic Processes.
LC Class. No.: QA465 / .D38 2009
Dewey Class. No.: 530.8
Data modeling for metrology and testing in measurement science
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