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Atomic scale characterization and fi...
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Walkosz, Weronika.
Atomic scale characterization and first-principles studies of Si3N4 interfaces
紀錄類型:
書目-電子資源 : 單行本
正題名/作者:
Atomic scale characterization and first-principles studies of Si3N4 interfaces/ by Weronika Walkosz.
作者:
Walkosz, Weronika.
出版者:
New York, NY :Springer Science+Business Media, LLC, : 2011.,
面頁冊數:
xiii, 108 p. :ill., digital ; : 24 cm.;
叢書名:
Springer theses
Contained By:
Springer eBooks
標題:
Interfaces (Physical sciences) -
電子資源:
http://dx.doi.org/10.1007/978-1-4419-7817-2
ISBN:
9781441978172 (electronic bk.)
Atomic scale characterization and first-principles studies of Si3N4 interfaces
Walkosz, Weronika.
Atomic scale characterization and first-principles studies of Si3N4 interfaces
[electronic resource] /by Weronika Walkosz. - New York, NY :Springer Science+Business Media, LLC,2011. - xiii, 108 p. :ill., digital ;24 cm. - Springer theses.
ISBN: 9781441978172 (electronic bk.)Subjects--Topical Terms:
123438
Interfaces (Physical sciences)
LC Class. No.: QC173.4.I57 / W35 2011
Dewey Class. No.: 541.33
Atomic scale characterization and first-principles studies of Si3N4 interfaces
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