Solid State Physics and Spectroscopy.

Single semiconductor quantum dots by: (Electronic resources)

Microscopy of Semiconducting Materials 2007 = proceedings of the 15th Conference, 2-5 April, 2007, Cambridge, UK / by: (Electronic resources)

Quantum Optics by: (Electronic resources)

Handbook of Molecular Force Spectroscopy by: (Electronic resources)

Materials for Information Technology = Devices, Interconnects and Packaging / by: (Electronic resources)

Spectroscopic Properties of Rare Earths in Optical Materials by: (Electronic resources)

Nano- and Micromaterials by: (Electronic resources)

Organic Nanostructures for Next Generation Devices by: (Electronic resources)

One-Dimensional Nanostructures by: (Electronic resources)

X-Ray Diffraction by Macromolecules by: (Electronic resources)

Advanced Time-Correlated Single Photon Counting Techniques by: (Electronic resources)

Transport equations for semiconductors by: (Electronic resources)

Transmission electron microscopy = a textbook for materials science / by: (Electronic resources)

Lithium niobate = defects, photorefraction and ferroelectric switching / by: (Electronic resources)

Advances in Solid State Physics by: (Electronic resources)

Half-metallic Alloys = Fundamentals and Applications / by: (Electronic resources)

Photoemission from optoelectronic materials and their nanostructures by: (Electronic resources)

Cryogenic mixed refrigerant processes by: (Electronic resources)

Thin Films and Heterostructures for Oxide Electronics by: (Electronic resources)

Microscopy of Semiconducting Materials = Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK / by: (Electronic resources)

Charged semiconductor defects = structure, thermodynamics and diffusion / by: (Electronic resources)

Applied Scanning Probe Methods. = Characterization /. IX by: (Electronic resources)

Fundamentals of shock wave propagation in solids by: (Electronic resources)

The Materials Science of Semiconductors by: (Electronic resources)

Applied Scanning Probe Methods. = Biomimetics and Industrial Applications /. X by: (Electronic resources)

Fundamentals of Powder Diffraction and Structural Characterization of Materials by: (Electronic resources)

Solid state gas sensing by: (Electronic resources)

The Physics of Organic Superconductors and Conductors by: (Electronic resources)

Surface and interface analysis = an electrochemist's toolbox / by: (Electronic resources)

Mid-infrared coherent sources and applications by: (Electronic resources)

Advanced power rectifier concepts by: (Electronic resources)

Vacuum Technology = Practice for Scientific Instruments / by: (Electronic resources)

Transparent Conductive Zinc Oxide = Basics and Applications in Thin Film Solar Cells / by: (Electronic resources)

Applied Scanning Probe Methods. = Scanning Probe Microscopy Techniques /. VIII by: (Electronic resources)

Planar double-gate transistor = from technology to circuit / by: (Electronic resources)

Quantum Kinetic Theory and Applications = Electrons, Photons, Phonons / by: (Electronic resources)

Applied scanning probe methods XI = scanning probe microscopy techniques / by: (Electronic resources)

Advanced batteries = materials science aspects / by: (Electronic resources)

Biophysics and the challenges of emerging threats by: (Electronic resources)

Laser Spectroscopy.. 2. Experimental Techniques by: (Electronic resources)

Dilute III-V Nitride Semiconductors and Material Systems = Physics and Technology / by: (Electronic resources)

Fundamentals of solid state engineering by: (Electronic resources)

Error Correction Codes for Non-Volatile Memories by: (Electronic resources)

Laser spectroscopy. = basic principles /. Vol. 1 by: (Electronic resources)

ESD Protection Device and Circuit Design for Advanced CMOS Technologies by: (Electronic resources)

LACAME 2004 = Proceedings of the 9th Latin American Conference on the Applications of the Mossbauer Effect (LACAME 2004) held in Mexico City, Mexico, 19-24 September 2004 / by: (Electronic resources)

Semiconductor nanocrystal quantum dots = synthesis, assembly, spectroscopy and applications / by: (Electronic resources)

Applied scanning probe methods XII = characterization / by: (Electronic resources)

Transmission Electron Microscopy and Diffractometry of Materials by: (Electronic resources)

IWNMS 2004 = Proceedings of the International Workshop on Nanomaterials, Magnetic Ions and Magnetic Semiconductors Studied Mostly by Hyperfine Interactions (IWNMS 2004) held in Baroda, India, 10-14 February 2004 / by: (Electronic resources)

Electron Scattering = From Atoms, Molecules, Nuclei, and Bulk Matter / by: (Electronic resources)

Liquid crystal display drivers = techniques and circuits / by: (Electronic resources)

Oxide and nitride semiconductors = processing, properties and applications / by: (Electronic resources)

Applied scanning probe methods XIII = biomimetics and industrial applications / by: (Electronic resources)

X-ray and neutron reflectivity = principles and applications / by: (Electronic resources)

Explosives detection using magnetic and nuclear resonance techniques by: (Electronic resources)

Semiconductor device physics and design by: (Electronic resources)

Fundamentals of power semiconductor devices by: (Electronic resources)