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Titles
Subjects
Integrated circuits - Testing - Statistical methods.
Overview
Works:
1 works in 1 publications in 1 languages
Titles
Data Mining and Diagnosing IC Fails
by:
(Electronic resources)
Subjects
Integrated circuits- Testing
Electronics and Microelectronics, Instrumentation.
Semiconductors- Failures.
Data mining.
Engineering.
Circuits and Systems.
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