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主題
Integrated circuits - Testing.
概要
作品:
2 作品在 2 項出版品 2 種語言
書目資訊
Nanometer technology designs = high-quality delay tests /
by:
(書目-電子資源)
High quality test pattern generation and boolean satisfiability
by:
(書目-電子資源)
主題
Electronics and Microelectronics, Instrumentation.
Electrical Engineering.
Circuits and Systems.
Nanotechnology.
Processor Architectures.
Integrated circuits- Testing.
Engineering.
Algebra, Boolean.
Nanoelectronics.
Computer-Aided Engineering (CAD, CAE) and Design.
Integrated circuits- Very large scale integration.
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